TEST CAPABILITIES AND RESOURCES
• We can design and build bespoke test solutions • Full test development service available using in house capabilities or in conjunction with external partners for: X-Ray, Flying Probe and Functional Solutions. • Complete JTAG / Boundary Scan Test – in system programming of flash, PLD, MCU and functional emulation tests. Links in with bar code recognition system at Herald for full product and test traceability |
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ATE (Automated Test Equipment)
MDA (Manufacturing Defect Analysis)
We produce test platforms to check for continuity, short circuits, open circuits, missing or incorrect components and solder joints.
Functional test solutions & ICT (In Circuit Test) Solutions
We have the following resources so each product can be fully tested to match the product specification and customer test requirements:
• National Instruments PXI
• LabView Programming
• WK - ATE Systems
• WK – Programming
• Bed of Nails Test Fixtures
Additional Test Recourses
• Manual test of products using customer supplied test equipment
• Fault finding to component level using circuit diagrams
• Extensive range of test equipment available for use in analogue, digital and RF circuits
